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Magazine Name : Ieee Design And Test Of Computers

Year : 2000 Volume number : 17 Issue: 04

Functionally Testable Path Delay Faults On A Microprocessors. (Article)
Subject:
Author: Angela Krstic      Kwang-Ting (Tim) Cheng      Wei-Cheng Lai     
page:      06 - 14
Power-/Energy-Eficient Bist Schemes For Processor Data Paths. (Article)
Subject:
Author: Mihalis Psarakis      Dimitris Gizopoulso      Nektarios Kranitis     
page:      15 - 28
Test Development For A Third-Version Coldfire Microprocessor. (Article)
Subject:
Author: Tersea L Mclaurin      Michael Mateja      Alfred. L Crouch     
page:      29 - 37
Effectiveness Of Microarchitecture Test. Program Generation. (Article)
Subject:
Author: John Paul Shen Shen      R. D Shawn      Noppanunt Utamaphethai     
page:      38 - 50
Collection And Analysis Of Microprocessor Design Errors. (Article)
Subject:
Author: John P Hayes      Trevor Mudge      David Van Campenhout     
page:      51 - 60
Validating Powerpc Microprocessor Custom Memories. (Article)
Subject:
Author: Magdy S Abadir      Andrew K Martin      Narayanan Krishnamurthy     
page:      61 - 76
Postssilicon Validation Methodology For Microprocessor. (Article)
Subject:
Author: Hemant Rotithor     
page:      77 - 89
Efficient Multiplexer Synthesis Technique. (Article)
Subject:
Author: Subhasish Mitra      Lanae J Avra      Edward J Mccluskey     
page:      90 - 97